Pendugaan Umur Simpan Metode Accelareted Shelf Life Test (ASLT) Dengan Pendekatan Arrhenius Pada Produk Wafer Flat di PT JMS

Balqis, Ratu (2021) Pendugaan Umur Simpan Metode Accelareted Shelf Life Test (ASLT) Dengan Pendekatan Arrhenius Pada Produk Wafer Flat di PT JMS. Project Report. IPB University.

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Official URL: https://sv.ipb.ac.id
Item Type: Monograph (Project Report)
Uncontrolled Keywords: energi aktivasi, ordo, penurunan mutu, wafer flat
Subjects: Student Project Report
Divisions: School of Vocational Studies > Food Quality Assurance Supervisor
Depositing User: Supervisor Jaminan Mutu Pangan SV IPB
Date Deposited: 13 Jan 2022 02:38
Last Modified: 13 Jan 2022 02:38
URI: https://ereport.ipb.ac.id/id/eprint/8831

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